XUV Photoelectron spectroscopy
Existing measurement capabilities will be maintained & options for spatially-dependent spectroscopy and imaging will expand.
Measurement efficiency will improve, to take advantage of 100-kHz repetition rate of existing FastLite system
Straightforward access to full 3D Brillouin zone will be developed.
Specifications:
Upgraded hemispherical analyzer (HA) with photoelectron deflectors
Time-of-flight momentum microscope
Microscopy
Spatially dependent spectroscopy
Efficient 3D data acquisition
6-axis motorized manipulator with liquid-He cooling and compressor
Preparation chamber for in-vacuo crystal preparation (sputtering, annealing, evaporation, cleaving) and sample storage
